The Keysight B1500A semiconductor parameter analyzer is an all-in-one device characterization analyzer supporting IV, CV, pulse / dynamic I-V, and more. The mainframe and plug-in modules enable the characterization of most electronic devices, as well as materials, semiconductors, and active/passive components. The B1500A semiconductor parameter analyzer modular architecture gives you the flexibility to upgrade when needed.
- Switch between CV and IV measurements without re-cabling.
- Capture ultra-fast transient phenomena not possible with other conventional test instruments.
- Detect multi-frequency AC capacitance measurements from a range of 1 kHz to 5 MHz.
Ready to use application libraries
Device type | Application tests |
CMOS transistor | Id-Vg, Id-Vd, Vth, breakdown, capacitance, and QSCV |
Bipolar transistor | Ic-Vc, diode, Gummel plot, breakdown, capacitance, and more |
Discrete device | Id-Vg, Id-Vd, Ic-Vc, diode, and more |
Memory | Vth, capacitance, endurance test |
Power device | Pulsed Id-Vg, pulsed Id-Vd, breakdown |
Nano device | Resistance, Id-Vg, Id-Vd, Ic-Vc |
Reliability test | NBTI/PBTI, charge pumping, electromigration, hot carrier injection, J-Ramp, TDDB, and more |
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Powerful capabilities of EasyEXPERT group+
Measurement capabilities | Staircase sweep, multi-channel sweep, pulse sweep, IV sampling, high-speed IV sampling, CV, C-t, C-f, etc. |
Switching matrix control | B2200, B2201 and E5250 (E5252 card) are supported. |
Analysis and data display capabilities | List-display, X-Y graph (with marker, cursor, and line), automatic analysis function, user function, and more |
Data management | User workspace management, save/recall measurement data and setting with auto-record feature |