The Tektronix Option PCE3 (Gen 1/2/3), Option PCE4 (Gen4) and Option PCE5 (Gen5) applications provide the most comprehensive solution for PCI Express Transmitter compliance testing as well as debug and validation of PCI Express devices against the PCI-SIG® specifications.
Key Features:
PCIe test supports compliance and validation of PCIe Gen1/2/3/4/5 interfaces based on PCIe Base and CEM specifications for Tektronix DPO/MSO70000 Series oscilloscopes
- Automated setup. Automatically sets up the oscilloscope horizontal and vertical scales to optimize signal quality for accurate analysis
- Automated acquisition / waveform management. Automatically acquires and saves the waveform per the PCI-SIG®-recommended naming convention to manage numerous waveforms that need to be acquired per lane for completing the Transmitter (Tx) test
- Automated DUT control. Automatically controls the DUT and steps it through the various supported speeds and presets necessary for Tx testing
- RF switch automation of PCIe3 test solution, supporting up to x16 lanes
- Support for NVMe physical layer testing, via add-in card device, or through a U.2 or M.2 connector
- De-embedding. De-embeds the effects of the channel, test fixtures, and cables to provide results that more accurately represent the signal (requires Option SDLA64 Serial Data Link Analysis)
- Test selection. Select the specification against which to perform the analysis, and select individual tests or groups of tests to perform targeted compliance analysis for failing tests
- SigTest integration. Uses SigTest EXE (using command line interface) to perform the analysis of acquired waveforms, providing the ability to test a system using the PCI-SIG®-recommended analysis tool
- Reporting. Compiles all test results into a customizable report with Pass/Fail results for easy analysis and record keeping
- Pattern matching. Verifies that the correct set of compliance patterns are sent by the transmitter before acquiring signals for compliance analysis
- PHY level protocol decode. Decodes and displays the PCIe data in a protocol-aware view. A time-correlated event table view with waveforms allows for quickly searching through events of interest
- Multi-lane testing. Perform analysis on multiple lanes of PCI express data to speed up the Tx analysis in a multi-lane system
- Compliance and debug. Provides a toolkit of DPOJET-based setups to quickly switch into debug and validation mode when a DUT fails compliance
- Analysis and debug tools. Tektronix provides a broad range of compliance, debug, and validation tools for Transmitter (Tx), Receiver (Rx), and protocol testing
- Comprehensive programmatic interface. Enables automation programs and scripts to call PCIe functions