Tektronix AFG3151C

The Tektronix AFG31000 Series is a high-performance AFG with built-in arbitrary waveform generation, real-time waveform monitoring, and the largest touchscreen on the market. Providing advanced waveform generation and programming capabilities, waveform verification, and a modern touch-screen interface, the new AFG31000 is sure to delight and simplify the job of every researcher and engineer.

Key Specifications:

•   1 or 2 channel models
•   Output amplitude range 1 mVP-P to 10 VP-P into 50 Ω loads

Basic (AFG) Mode:

•   25 MHz, 50 MHz, 100 MHz, 150 MHz, or 250 MHz sine waveforms
•   250 MSa/s, 1 GSa/s or 2 GSa/s sample rates
•   14-bit vertical resolution
•   Built-in waveforms include sine, square, ramp, pulse, noise, and other frequently used waveforms Sweep, Burst, and Modulation modes (AM, FM, PM, FSK, and PWM)

Key Features:

•   Patented InstaView™ technology enables engineers to see the actual
•   waveform at the Device Under Test (DUT) in real time, without the need of an oscilloscope and probe, eliminating the uncertainty caused by mismatched impedance
•   Sequencing option adds the ability to program long, complex waveforms with up to 256 steps
•   The 9-inch capacitive touch screen works like a smart phone and has short-cuts to frequently used settings
•   Built-in ArbBuilder lets you create and edit arbitrary waveforms on the instrument, eliminating the need to connect to a PC
•   Outputs are protected from over voltage and current to minimize potential instrument damage
•   Built-in Double Pulse Test application to generate voltage pulses with varying pulse widths onto the DUTs

Advanced (Sequence) Mode:

•   Continuous mode (optional Sequence, Triggered and Gated modes)
•   16 Mpts arbitrary waveform memory on each channel (128 Mpts optional)
•   Up to 256 steps in sequence mode with loop, jump and wait events
•   Variable sampling clock 1 µSa/s to 2 GSa/s

Applications:

•   Advanced research
•   Clock and system synchronization
•   Replication of real world signals
•   Component and circuit characterization and validation
•   Embedded circuit design and test
•   General purpose signal generation
•   Double pulse test