The SD-24 is a dual-channel TDR/Sampling Head. This sampling head has a rise time of 17.5 ps or less, with a typical 20 GHz equivalent bandwidth.
Each channel of the SD24 is also capable of generating a fast rising step for use in Time Domain Reflectometry (TDR). In TDR mode, the acquisition portion of the sampling head monitors the incident step and any reflected energy. The reflected rise time of the TDR step is 35 ps or less. The polarity of each channel's TDR step can be selected independently of the other channel. This allows for differential or common-mode testing of two coupled lines, in addition to the independent testing of isolated lines. The SD24 can be used to characterize crosstalk by using the TDR step to drive one line while monitoring a second with the other channel.
The "filter" function on the CSA803C/11801C can be used with TDR or crosstalk measurements to characterize a system at a slower rise time.
Specifications |
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Digital Sampling Oscilloscope |
|
Model Overview |
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Model | Description |
11801C | Digital Sampling Oscilloscope |
Included Accessories | User Manual
Programmer Manual
Service Manual
12in. SMA-SMA Cable
1 Wrist Strap
|
Sampling Head |
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SD-14 | 3-GHz high-impedance (100 kilohm/0.475 pF) dual-channel probe sampler |
SD-20 | 20-GHz single-channel loop-through head |
SD-22 | 12.5-GHz dual-channel low-noise head |
SD-24 | 20-GHz dual-channel TDR/sampling head |
SD-26 | 20-GHz dual-channel sampling head |
SD-32 | 50-GHz, single-channel sampling head |
SD-42 | 6.4-GHz O/E converter (55-ps optical pulse response FWHM) |
SD-44 | 15-GHz O/E converter |
SD-51 | 20-GHz trigger head |
The 11801C Digital Sampling Oscilloscope offers the widest range of on-board measurement and waveform processing capabilities of any multi-Gigahertz scope. With excellent measurement repeatability, exceptional vertical resolution, and fast display update rate, the 11801C is a powerful measurement tool for semiconductor testing, TDR characterization of circuit boards, IC packages and cables, and high-speed digital data communications.
Key Features |
DC To 50-Ghz Bandwidth |
7-ps Rise Time |
Eight Channels, Expandable to 136 (with SM-11 multichannel units) |
High Resolution and Measurement Repeatability |
10-Femtosecond Sampling Interval (0.01 ps) |
Modular Architecture |
Dual-Timebase Allows Multiple Windows |
FFT |
Predefined Telecom Masks |
True Dual-Step Differential TDR |
Fully Automatic Jitter and Noise Measurements |
Automatic Statistical Measurements, Histograms, and Mask Testing |
Automatic Pulse Measurements with Statistics |
Comprehensive Waveform Processing |
Complete Programmability for ATE Applications |
Colour Display with Colour Grading |
Applications |
Semiconductor Test |
TDR Characterization |
High-Speed Digital |
Data Communication |
The modular microprocessor-based architecture of the 11801C not only allows you to select the right configuration for your application, but also allows expandability to meet your future measurement needs. The 11801C accepts up to 4 dual-channel sampling heads and can be expanded through the SM-11 Multichannel Units to 136 channels.
There are currently nine sampling heads to choose from:
Specifications |
|
Digital Sampling Oscilloscope |
|
Model Overview |
|
Model | Description |
11801C | Digital Sampling Oscilloscope |
Included Accessories | User Manual
Programmer Manual
Service Manual
12in. SMA-SMA Cable
1 Wrist Strap
|
Sampling Head |
|
SD-14 | 3-GHz high-impedance (100 kilohm/0.475 pF) dual-channel probe sampler |
SD-20 | 20-GHz single-channel loop-through head |
SD-22 | 12.5-GHz dual-channel low-noise head |
SD-24 | 20-GHz dual-channel TDR/sampling head |
SD-26 | 20-GHz dual-channel sampling head |
SD-32 | 50-GHz, single-channel sampling head |
SD-42 | 6.4-GHz O/E converter (55-ps optical pulse response FWHM) |
SD-44 | 15-GHz O/E converter |
SD-51 | 20-GHz trigger head |