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Devis Rapide: Tektronix BA1600

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Tektronix BA1600

Pattern Generator and Error Detector; 1.6 Gb/s

Modèle

BA1600

Gamme de produits

Digital Design

Fabricant

Tektronix

Cette configuration a les caractéristiques suivantes:

Digital DesignBER Testing 1-1400MB/s

Configurations

Caractéristiques principales

Description produit

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Description produit

The BitAlyzer Bit Error Rate Testers BA Series are the industry’s best solution to the challenging signal integrity and BER issues faced by designers verifying, characterizing, debugging, and testing sophisticated electronic and satellite communication system designs. The BitAlyzer BA Series features exceptional performance in signal generation and analysis, operational simplicity, and unmatched debugging tools to accelerate your day-to-day tasks. The most comprehensive suite of physical-layer test tools available and the intuitive user interface provide easy access to the maximum amount of information.

Key Features

Pattern Generation and Error Analysis, highspeed BER Measurements up to 1.6 Gb/s

Integrated, BER correlated eye diagram analysis with pass/fail masks

Error Location and BER contour analysis on PRBS signals up to 1.6 GB/sec

ANSI Jitter Measurements (RJ, DJ, and TJ)

BER Contour with Automatic Mask Creation

Benefits

The combination of generation and analysis in one instrument enables receiver BER compliance testing for today’s electronic and communications systems

Rapidly understand BER performance limitations, assess deterministic vs random errors, perform detailed pattern dependent error analysis, error burst analysis, and perform error free interval analysis.

Provides a quick understanding of signal integrity in terms of BER. Error location provides detailed BER pattern sensitivities to speed up identification of deterministic vs. random BER errors

Fast, effective method for determining long pattern PRBS31 jitter composition with triangulation. Graphical representation makes jitter analysis more thorough, yet simpler to follow.

Measure and view the eye diagram opening as a function of BER.

Specifications
Bit Error Rate Tester - BitAlyzer BA Series
Ordering Information
Model	Standard Instrument	Option PL
BA1600	1.6 Gb/s Pattern Generator and Error Analyzer	Add Physical Layer Test Suite, MAP (Error Mapping analysis), and ECC (Error Correction Coding emulation)
BA1500	1.5 Gb/s Pattern Generator and Error Analyzer	Add Physical Layer Test Suite, MAP (Error Mapping analysis), and ECC (Error Correction Coding emulation)

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