The TDS7000B Series’ unique combination of superior measurement fidelity, unrivaled analysis, and uncompromised usability makes it the ultimate test machine to simplify and speed the design of high-speed, complex systems. This family offers the industry’s best solution to the challenging signal integrity issues faced by designers verifying, characterizing, and debugging sophisticated electronic designs.
They deliver up to 7.25 GHz (typical) true analog bandwidth, down to 43 ps rise time (20% - 80%), and 20 GS/s maximum real-time sample rate to capture critical events with fine detail. Exclusive DPX® acquisition technology enables waveform capture rates up to 400,000 wfms/s to quickly find rare glitches in seconds or minutes, instead of hours or days. Innovative software solutions deliver domain expertise for advanced analysis and compliance testing, while the OpenChoice® architecture enables users to integrate their expertise through the ability to easily write custom programs or utilize popular commercial software. The intuitive graphical user interface delivers sophisticated capability to advanced users without intimidating occasional users.
Key Features:
- Up to 7.25 GHz True Analog Bandwidth and Down to 43 ps Risetime (20% - 80%)
- > 400,000 wfms/s Waveform Capture Rate, powered by exclusive DPX® acquisition technology
- 20 GS/s Maximum Real-time Sample Rate
- Exceptional Delta-time Accuracy for High-confidence in Critical Timing Measurements
- MyScope® Custom Control Windows Enhance Productivity
- Right Mouse Click Menus for Exceptional Efficiency
- Powerful Triggering Features for Fast Detection of Relevant Faults
- Communications Mask Testing Up to 4.25 Gb/s Rates
- Clock Recovery from Serial Data Streams up to 3.125 Gb/s
- Up to 64 MB Record Length with MultiView Zoom™ for Quick Navigation of Long Records
- TekConnect® Interface for High Fidelity Connection
- Classic Direct Controls, Touch-sensitive Display, or Mouse Navigation
- OpenChoice® with Microsoft Windows 2000 Delivers Built-in Networking and Analysis
- XGA 1024x768 display
Applications:
- Signal Integrity, Jitter, and Timing Analysis
- Verification, Debug, and Characterization of Sophisticated Designs
- Design, Development, and Compliance Testing of Serial Data Streams Up to 4.25 Gb/s Rates
- Debug of Telecom, Datacom, and Storage Area Network Equipment Designs, and High-speed Backplanes
- Spectral Analysis
- Investigation of Transient Phenomena
