Fastest diffraction-grating-based instrument operating from 1250 to 1700 nm. Provides fast, accurate, high dynamic range scan. Unique touch-sensitive display with multitouch gesture control.
The OSA20 is the only grating-based optical spectrum analyzer that combines state-of-the-art performance, ease of use, automation, top-shelf analysis tools and fast measurements. This makes it ideal not only for next-gen optical telecom network R&D but also for manufacturing of high-end products such as transceivers or ROADMs.
| Key Features |
| Wavelength range of 1250-1700 nm |
| Wavelength accuracy of ±10 pm over 1500-1640 nm and ±25 pm over 1250-1700 nm |
| Wavelength resolution of 20 pm (native), adjustable over 50-2000 pm |
| Full automation using SCPI commands |
| Sweep speed up to 2000 nm/s |
| 8 application-oriented analysis modes and full suite of analysis tools |
| Intuitive user interface with 12-inch touchscreen |
| Built-in wavelength calibration source |
| Power level accuracy of ±0.4 dB |
| Benefits |
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| Accurate | The OSA20’s monochromator is built around EXFO’s renowned filter technology.
Its narrow bandwidth (20 pm) is maintained throughout the spectral range of operation (1250 – 1700 nm).
The monochromator also stands out by its extremely sharp filter edges and low stray light, ideal for optical signal to noise ratio (OSNR) measurement of tightly packed WDM channel testing.
The OSA20 has a best-in-class wavelength repeatability of ±2 pm and accuracy of ±10 pm specified over 1500-1640 nm and comes with its own built-in wavelength calibration source.
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| Fast | The OSA20 is the fastest optical spectrum analyzer of its kind with a maximum sweep speed of 2000 nm/s and a fixed sampling resolution of 2 pm for all scans.
This means every measurement is taken at the highest resolution and the highest accuracy.
Sweep speed is determined solely by the choice of the sensitivity level: -55 dBm at 2000 nm/s down to -90 dBm by averaging over 380 scans with HIGH at 0.5 nm/s.
With a sweep rate of about 3 scans per seconds covering the C+L band (at -60 dBm sensitivity), the OSA20 is the ideal tool for quick and precise optical alignment followed by high resolution characterization.
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| Easy to Use | The OSA20 brings optical spectral testing into the 21st century with a 12-inch capacitive multitouch screen, an industry first and its intuitive graphical user interface (GUI) for fast navigation and scrolling through single setup menus.
With pinch-to-zoom gesture and automated signal search algorithms, getting to the interesting data has never been easier! Keyboard, mouse or hard drive can also be used through the many USB interfaces.
And to make sure to get the best measurement, the OSA20 is also fitted with an optical connector plate that can be easily removed to inspect and clean the optical fiber connectors.
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| Efficient Analysis Features | The OSA20 comes with built-in application-oriented analysis adapted to different types of spectrum or acquisition techniques.
WDM: wavelength division multiplexing with OSNR tool compatible with 400G+ spectrum.
RLT: the recirculating loop transmission mode is a special version of WDM specially designed to be used in a long-distance transmission simulation with an optimized signal acquisition algorithm.
SML: singlemode laser characterization of side mode suppression ratio (SMSR), central wavelength and optical power for distributed feedback Bragg laser diodes, tunable lasers or transceivers.
OFA: optical fiber amplifier characterization of gain and noise figure for semiconductor, Raman or fiber optical amplifiers.
PCT: passive component tester characterization of optical filters, isolators or fibers. This mode can also be used for fast alignment of optical devices.
BBS: broadband source characterization of super luminescent or edge-emitting LED.
MML: multimode laser characterization of multiple longitudinal model lasers, such as Fabry-Perot laser diodes.
OSA: optical spectrum analyzer general operation mode containing most of the analysis tools available on the OSA20 for any signal that does not fit one of the above modes.
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| Applications |
| Characterization of next-gen WDM signals (CWDM, DWDM, ROADM and Flexgrid) |
| Characterization of multiple longitudinal mode laser sources (e.g., Fabry-Perot laser diodes) |
| Long distance transmissions system analysis with a recirculating loop |
| Characterization of optical fiver amplifiers (e.g., Erbium Doped Fiver Amplifier) |
| Characterization of singlemode lasers (e.g., laser diode, DFBs, µiTLA or optical transceiver) |
| Characterization of broadband sources (semiconductor, Raman/fiber optical amplifiers, superluminescent or edge-emitting LED) |
| Characterization of passive components (e.g., optical filters, isolators or fibers) |
| 400G+ OSNR testing capability |
| Specifications |
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OSA20
Optical Spectrum Analyzer
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| Feature | Parameter |
| Operating Temperature | 5 °C to 35 °C
41 °F to 95 °F
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| Performance Guaranteed Temperature | 18 °C to 28 °C
64 °F to 82 °F
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| Storage Temperature | –10 °C to 50 °C
14 °F to 122 °F
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| Humidity | 80 % RH, non condensing |
Dimensions
(W x H x D)
| 413 mm x 314 mm x 385 mm
16 ¼ po x 12 ⅜ po x 15 ⅛ po
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| Weight | 15 kg
33 lb
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| Power Supply | 48 V DC input, ≤ 75 VA
(adapter 100-240 V AC, 50-60 Hz to 48 V DC provided)
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| Screen | 12 inch capacitive touchscreen
(res. 1024 x 768)
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| External Devices | Screen: VGA Port (x1), DVI-D Port (x1), HDMI (x1)
Others (e.g., mouse, hard disk): USB 2.0-A (x4), USB 3.0-A (x2)
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| Remote Interface | Ethernet (2x RJ45): 1 Gbit/s max.
GPIB (1x IEEE 488): 7.2 Mbit/s max.
USB (1x USB 2.0-B): 115 kbit/s max.
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| Triggers | In: Start scan (BNC, 5 V TTL), Gate in RLT mode
Out: Pulse on a user-defined span (BNC, 5 V TTL)
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| Data Storage | Internal: 256 Go
External: FAT32, NTFS
File Types: csv, binary, jpg, png
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| Specifications |
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OSA20
Optical Spectrum Analyzer
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| Model Overview |
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| Model | Description |
| Connector (OSA20-XX) |
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| 50 | FC/PC |
| 54 | SC/PC |
| 58 | FC/APC |
| 88 | SC/APC |
