The 2650 Series High Power SourceMeter SMU Instruments are designed specifically for characterizing and testing high voltage/current electronics and power semiconductors, such as diodes, FETs, and IGBTs, high brightness LEDs, DC-DC converters, batteries, solar cells, and other high power materials, components, modules, and subassemblies. They deliver unprecedented power, precision, speed, flexibility, and ease of use to improve productivity in R&D, production test, and reliability environments. Two instruments are available offering up to 3000V or up to 2000W of pulse current power
The Model 2651A High Power System SourceMeter® Instrument is designed to characterize and test high current and high power electronics. The wide dynamic range (50A, 40V, 100fA) of this SMU instrument can help you improve productivity in applications across the R&D, reliability, and production spectrums.
Through the TSP-Link interface and embedded "Plug & Play" web software, the model 2651A can be combined with another 2651A to increase the maximum current range to 100A, with other Series 2600B SourceMeters to create SMU-per-pin test systems, or with the Model 2657A to create high power test systems capable of 3000V and 100A. Optional test fixtures and system-level accessories are also available.
| Key Features |
| Highly flexible, four-quadrant voltage and current source/load coupled with precision voltage and current meters |
Source or sink (2651A) up to 2,000W of pulsed power (±40V, ±50A) or up to 200W of DC power (±10V@±20A, ±20V@±10A, ±40V@±5A);
easily connect two units (in series or parallel) to create solutions up to ±100A or ±80V
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| Source or sink (2657A) up to 180W of DC or pulsed power (±3000V@20mA, ±1500V@120mA) |
| Built-in web browser based software |
| Choice of digitizing or integrating measurement modes |
| TSP (Test Script Processing) technology |
| TSP-Link channel expansion bus |
| Compatible with Model 8010 High Power Device Test Fixture and Model 8020 High Power Interface Panel |
| Free Test Script Builder software tool |
| Optional ACS Basic semiconductor component characterization software |
| Benefits |
| Offers best-in-class performance with 6½-digit resolution. |
Supports characterization/testing of power semiconductors, HBLEDs, optical devices, solar cells, and GaN, SiC, and other compound materials and devices.
Applications include semiconductor junction temperature characterization; high speed, high precision digitization; electromigration studies; and high current, high power device testing.
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| Provides the high voltage required for power semiconductor device characterization and testing, including GaN, SiC, and other compound materials and devices, breakdown and leakage testing to 3kV, and characterization of sub-millisecond transients. |
| Allows for remote control through any browser, on any computer, from anywhere in the world. |
| Supports characterizing transient and steady-state behavior precisely, including rapidly changing thermal effects. |
| Allows easy system integration with Model 2657A and Series 2600B models. |
| Enables multiple 2651As and 2657As and selected Series 2600B SMU instruments to be combined to form an integrated system with up to 32 channels. |
| Provides safe and easy connections for testing high power devices at either the packaged part or wafer level. |
| Helps you create, modify, debug, and store TSP test scripts. |
| Maximizes productivity when performing packaged part characterization during development, quality verification, or failure analysis. |
| Specifications |
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Keithley SMU 2650 Series
High Power SourceMeter
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| Model | Channels | Max Current Source/Measure Range | Max Voltage Source/Measure Range | Measurement Resolution
(Current / Voltage)
| Power |
| 2651A | 1 | 50A | 40V | 100fA / 100nV | 2000 W |
| 2657A | 1 | 120mA | 3000V | 1fA / 100nV | 180 W |
