PCI Express Tx Compliance Software
The PCI Express electrical performance validation and compliance software provides you with a fast and easy way to verify and debug your PCI Express designs. The PCI Express electrical test software allows you to automatically execute PCI Express electrical tests for endpoints, root complex and new ASICs (chip level) and displays the results in a flexible report format. In addition to the measurement results, the report provides a margin analysis that shows how closely your device passed or failed each test.
The PCI Express electrical test software includes tests for verifying that your transmitter is compliant with the PCI Express 4.0 BASE specification at 16 GT/s which also includes uncorrelated jitter measurements and other tests while also offering updated PCIe 4.0 reference clock tests.
The PCI Express electrical test software utilizes the Q-domain approach (PCI Express 3.0 and 4.0 BASE specification) for 8G and 16G BASE jitter measurements and uses a Dual Dirac method for 5G jitter separation (described in the PCI Express 2.0 BASE and Card Electromechanical specifications). This ensures that your PCI Express TX measurements will have consistency with measurements made using the PCI-SIG’s standalone SigTest software.
Features
- Integration of automated control for selected high speed switching systems from Keysight and Bitifeye
- Integrated DUT control for endpoint or root complex devices using an 81150A or 81160A Pulse Function Arbitrary Noise Generator.
- Workshop compliance mode for automating PCISIG CEM compliance tests and report generation using Sigtest
- Test setup wizard guides you through test selection, configuration, connection, execution, and results reporting
- Measurement connection setups are displayed, and oscilloscope setup is automatically configured for each test
- Test results report documents test configuration, measurements made, pass/fail status, margin analysis, and waveforms, and a switching solution is available for automated multilane testing
Standards supported
- PCI Express® BASE and CEM 4.0 Transmitter Tests
- PCI Express® 1.1, 2.0, 3.0, and 4.0 Reference Clock Tests
- PCI Express® 1.0, 1.1, 2.0, 3.0 CEM and BASE spec tests
- PCI Express® SFF-8639 (U.2) endpoint and root complex tests.
- Consistent results with Sig Test for 1.0a, 1.1, 2.0, 3.0, 4.0 for CEM (compliance) analysis
- Supports de-embedding of test fixtures and cables with the optional InfiniiSim Waveform Transformation Toolset
